AccuFiz SIS

Surface Isolation Source for measuring plane-parallel optics.

Measure one or both surfaces of a transparent optic—without coating the surfaces. Transmitted wavefront error, optical thickness and homogeneity can be calculated, even on thinner materials.

AccuFiz SIS Specs

For use with	AccuFiz Fizeau interferometers
Source	Fiber-coupled short coherence
Wavelength	635-640 nm diode
Output Power	1–3 mW
Software	4Sight™ Focus included
Size	38.1 cm (15 in) long
Reflectivities	1 – 100% (attenuation required)

Download Complete AccuFiz SIS Specs

Plane-parallel optics are transparent components with parallel faces, or systems with two or more parallel surfaces. Measuring any one surface with an interferometer is extremely difficult or impossible, as all parallel surfaces contribute fringes to the interferogram.

4D’s Surface Isolation Source is an optional, external laser source that excludes all but the surface of interest. The SIS module lets you measure both surfaces of a transparent optic with a standard AccuFiz interferometer. You can also calculate transmitted wavefront error, optical thickness and homogeneity, all from a single measurement setup.

The adjustable path match mechanism provides flexibility, letting you dial in any surface that is within 88 through 112 millimeters from the aperture.

AccuFiz SIS Specs

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Measuring Thin Transparent Optics

What is a Fizeau Interferometer?

data

analysis

software

Introducing 4Sight Focus

The all-new 4Sight Focus analysis software—included with all 4D interferometers and optical profilers—provides blazing fast acquisition, rich visuals, and a wealth of analysis features.